Single-crystal X-ray diffraction is a powerful method in chemistry and materials science that makes it possible to determine the three-dimensional structure of molecules in crystals. In a typical experiment, a monocrystalline specimen is irradiated using an X-ray source and the resulting diffraction pattern can be analyzed to determine structural parameters such as atomic positions, and interatomic distances and angles.
We offer diffraction measurements on our dual X-ray source instrument using either Mo K(alpha) or Cu K(alpha) radiation. While the shorter wavelength (0.71 Å) X-rays from the Mo source provide higher resolution, the more intensely diffracted X-rays from Cu (1.54 Å) are often needed when measuring weakly-diffracting crystals.
More Information regarding our instrumentation and service below.
Here is link to a website (external) with useful information about growing quality crystals
Other methods to consider: NMR, Mass Spectrometry and CHNS Determination
Instrument
Single Crystal X-ray Diffractometer
Rigaku/Oxford SuperNova (N25/1207)
X-ray Sources
- Mo and Cu microfocus sealed X-ray tubes
Detection
- Atlas Charged-Coupled Device (CCD) Detector
- Active Area (circular): 135 mm diameter
Sample Temperature Range
- r.t. to -150 °C
- Inorganic und metal-organic complexes
- Organic molecules (small to medium size)