Title: Introduction to the Focused Ion Beam (FIB) Center UUlm

Speaker: Dr. Gregor Neusser, Focused Ion Beam Center UUlm

The talk will give an overview about the analytical tools provided by two focussed ion beam / scanning electron microscopes (FIB/SEM) hosted by the FIB Center UUlm and a brief introduction to methods like FIB, SEM & EDX. The focuss of the presentation will be FIB and its applications like cross-sectioning, FIB/SEM tomography, prototyping and sample preparation by FIB.  

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Meeting-ID: 639 1157 7962
Kenncode: 89549125