TEM investigation of the growth of ZnO on a-plane sapphire (Al2O3). Selected area electron diffraction of ZnO layer and Al2O3 substrates reveals the crystal orientation relationship. Aberration corrected HRTEM reaveals the structure of the interface, cooperation with Prof. Thonke (Inst. of Semiconductor Physics / Quantum Matter)
FIB-structuring of an colloidal lithographic produced "antidot array", for magnetoresistance measurements to local study the remagnetization. The interferences in the overview (left) were used to choose regions with a homogeneous distribution of the holes. Service for Prof. Ziemann (Department of Solid State Physics)