U. Kaiser, J. Biskupek and K. Gärtner:
'Magic-size' GeSi and Si nanocrystals created by ion bombardment of hexagonal SiC; a molecular dynamics study
Philosophical Magazine Letters 83-4 (2003) 253-263

U. Kaiser and A. Chuvilin:
Enhanced Compositional Contrast in Imaging of Nanoprecipitates Buried in a Defective Crystal Using a Conventional TEM
Microsc. Microanal. 9 (2003) 36-41

U. Kaiser and A. Chuvilin:
Z-contrast imaging in a conventional TEM
Microsc. Microanal. 9 (Supplement 3 - Proceedings of Microscopy Conference MC 2003) (2003) 78

Th. Kups and U. Kaiser:
On the site occupancy of dopants in 4H-SiC
Microsc. Microanal. 9 (Supplement 3 - Proceedings of Microscopy Conference MC 2003) (2003) 82
<link typo3/papers/mc2003-2.pdf top>electronic version 230kb</link>

J. Biskupek, U. Kaiser and A. Chuvilin:
Considerations on the accuracy of lattice parameters determined from HRTEM images
Microsc. Microanal. 9 (Supplement 3 - Proceedings of Microscopy Conference MC 2003) (2003) 166

U. Kaiser and J. Biskupek:
What determines the structure of GeSi nanocrystals embedded in polytypic SiC?
Microsc. Microanal. 9 (Supplement 3 - Proceedings of Microscopy Conference MC 2003) (2003) 182
<link typo3/papers/mc2003-4.pdf top>electronic version 400kb</link>

J. Biskupek, U. Kaiser and A. Chuvilin:
Defects in hexagonal SiC analyzed by Molecular Dynamics and HRTEM image simulations
Microsc. Microanal. 9 (Supplement 3 - Proceedings of Microscopy Conference MC 2003) (2003) 204

U. Kaiser:
TEM Characterization of Nanostructured Materials - Opportunities and Challenges
Microsc. Microanal. 9 (Supplement 3 - Proceedings of Microscopy Conference MC 2003) (2003) 218
<link typo3/papers/mc2003-6.pdf top>electronic version 90kb</link>

A. Chuvilin, Th. Kups and U. Kaiser:
Lattice parameter measurement by CBED: Accuaracy limited by the noise
Microsc. Microanal. 9 (Supplement 3 - Proceedings of Microscopy Conference MC 2003) (2003) 356

U. Kaiser, K. Cai, M. Müller, J. Bossert and K. Jandt:
The Nanostructure of Evaporated Titanium Thin Films for Biological Performance Studies
Microsc. Microanal. 9 (Supplement 3 - Proceedings of Microscopy Conference MC 2003) (2003) 456

S. Bai, R.P. Devaty, W. Choyke, U. Kaiser, G. Wagner:
Quantum Confined Stack effect in 4H/3C/4H-SiC quantum wells
Appl. Phys. Lett. 83 (2003), 3171

F. Bechstedt, A. Fissel, J.U. Furthmüller, U. Kaiser, H.-Ch. Weissker, W. Wesch:
Quantum structures in SiC
Appl. Surf. Science 212-213 (2003) 820-825

H. Metzner, Th. Hahn, J. Cieslak, J. Eberhardt, M. Müller, U. Reislöhner, U. Kaiser,A. Chuvilin, J. Kräußlich und W. Witthuhn:
Structural Properties of MBE grown Cu(In, Ga)S2 layers on Si
Journal of Physics and Chemistry of Solids, (2003) 64(9-10), 1491-1494

Th. Hahn, H. Metzner, J. Cieslak, J. Eberhardt, M. Müller, U. Kaiser, A. Chuvilin, U. Reislöhner, W. Witthuhn, R. Goldhahn, F. Hudert und J. Kräußlich:
Epitaxial CuIn(1-x)GaxS2 on Si (111): A perfectly lattice matched system for x˜0.5
Applied Physics Letters, (2003) 83(8), p.1563-1565

J. Cieslak, H. Metzner, Th. Hahn, U. Reislöhner, U. Kaiser, J. Kräußlich und W. Witthuhn:
Microstructure of epitaxial CuGaS2 on Si(111)
Journal of Physics and Chemistry of Solids, (2003) 64(9-10), p.1777-1780

H. Metzner, J. Cieslak, U. Grossner, Th. Hahn, U. Kaiser, J. Kräußlich, U. Reislöhner,W. Witthuhn, R. Goldhahn, and J. Eberhardt:
Structural and optical properties of epitaxial CuGaS2 films on Si substrates
Thin Solid Films 431-432 (2003) 219-223